Progress with the implementation of a shearography system for the testing of technical components

Wolfgang Osten; Torsten Baumbach; Claas Falldorf; Michael K. Kalms; Werner P. O. Jueptner

doi:10.1117/12.484540

29 July 2002 Progress with the implementation of a shearography system for the testing of technical components

Wolfgang Osten, Torsten Baumbach, Claas Falldorf, Michael K. Kalms, Werner P. O. Jueptner

Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484540
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation

Abstract

Shearography is an approved and powerful tool for the non-destructive inspection of industrial components with respect to material faults and technical imperfections. An application field of high interest is the in-service inspection of aircraft and automotive components. However, the non-cooperative character of the surface of various technical components has to be taken into account carefully. This paper describes a complete test facility consisting of a shearographic sensor, adapted loading equipment for thermal and mechanical stressing and a new evaluation software ensuring a high sensitivity for fault detection. To increase the performance of the system with respect to industrial applications new components and procedures were implemented and tested recently. To them belong a CMOS-camera to increase the dynamic range of the image sensor, a multiband light source to test the coherence requirements of a shearography system and tunable thermal loading equipment to improve the identification of material faults within components having a bigger wall thickness.

Citation Download Citation

Wolfgang Osten, Torsten Baumbach, Claas Falldorf, Michael K. Kalms, and Werner P. O. Jueptner "Progress with the implementation of a shearography system for the testing of technical components", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); https://doi.org/10.1117/12.484540

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