Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer

Takamasa Suzuki; Tatsuhiko Sekimoto; Osami Sasaki

doi:10.1117/12.465657

20 September 2002 Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer

Takamasa Suzuki, Tatsuhiko Sekimoto, Osami Sasaki

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Proceedings Volume 4919, Advanced Materials and Devices for Sensing and Imaging; (2002) https://doi.org/10.1117/12.465657
Event: Photonics Asia, 2002, Shanghai, China

Abstract

We propose a new range finding technique that uses two-wavelength interferometry. The system we propose uses a single laser diode to realize a two-wavelength interferometer, which expands measurement range. The single light-source allows us to simplify the optical setup. Our device generates two independent interference signals with respect to the wavelengths generated by offset current. The external disturbances on these interference signals are eliminated by the feedback control. Although the feedback control eliminates disturbance as well as the information about the distance, we are able to detect the distance from the phase difference between those compensated interference signals.

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Takamasa Suzuki, Tatsuhiko Sekimoto, and Osami Sasaki "Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer", Proc. SPIE 4919, Advanced Materials and Devices for Sensing and Imaging, (20 September 2002); https://doi.org/10.1117/12.465657

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KEYWORDS

Interferometers

Semiconductor lasers

Distance measurement

Phase interferometry

Feedback control

Interferometry

Lithium

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