CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 4920 > Article
Paper
9 September 2002 Measurement of out-of-plane vibrations by processing digital speckle pattern interferometry fringes using wavelet transform
Chandra Shakher, Rajesh Kumar
Author Affiliations +
Proceedings Volume 4920, Advanced Sensor Systems and Applications; (2002) https://doi.org/10.1117/12.481964
Event: Photonics Asia, 2002, Shanghai, China
Abstract
In this paper we present a new filtering scheme for processing of DSPI fringes and implemented the same to measure the out-of-plane vibration in a rectangular plate fixed at one end and free at another end. Values of the amplitude measured by DSPI and accelerometer are in good agreement. Also mode shapes obtained from the experimental data and from the theory are almost similar.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Chandra Shakher and Rajesh Kumar "Measurement of out-of-plane vibrations by processing digital speckle pattern interferometry fringes using wavelet transform", Proc. SPIE 4920, Advanced Sensor Systems and Applications, (9 September 2002); https://doi.org/10.1117/12.481964
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 8 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Wavelets
Fringe analysis
Digital filtering
Speckle
Signal to noise ratio
Speckle pattern
Interferometry
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top