Phase-shift interferometry surface plasmon microscopy

Jun Guo; Wei Wei; Jihua Guo

doi:10.1117/12.481729

5 September 2002 Phase-shift interferometry surface plasmon microscopy

Jun Guo, Wei Wei, Jihua Guo

Proceedings Volume 4923, Nano-Optics and Nano-Structures; (2002) https://doi.org/10.1117/12.481729
Event: Photonics Asia, 2002, Shanghai, China

Abstract

A novel optical imaging method that makes use of surface plasmon microscopy (SPM) and phase shift interferometry is developed. It is named phase shift interferometry-surface plasmon microscopy (PSI-SPM). In comparison with SPM, it can measure not only the intensity of the light reflected under SPR conditions, but also the phase of the light. The images of higher resolution (compared with SPM) can be obtained through the synthesis of the phase (color) and intensity (brightness) information.

Citation Download Citation

Jun Guo, Wei Wei, and Jihua Guo "Phase-shift interferometry surface plasmon microscopy", Proc. SPIE 4923, Nano-Optics and Nano-Structures, (5 September 2002); https://doi.org/10.1117/12.481729

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