Testing optical materials by birefringence dispersion mapping

Andrzej L. Bajor

doi:10.1117/12.497176

1 April 2003 Testing optical materials by birefringence dispersion mapping

Andrzej L. Bajor

Proceedings Volume 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (2003) https://doi.org/10.1117/12.497176
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 2003, 2003, Moscow, Russian Federation

Abstract

In many optical applications of crystals birefringence dispersion seems to play an equal role to birefringence spatial inhomogeneity itself. Mapping of parameters associated with birefringence dispersion on the entire areas of wafers cut out from crystalline boules seems then to be a powerful tool in testing and research works dealing with optical materials. The method of birefringence dispersion mapping and an automated, computer-controlled spectropolarimeter have been described. Its working has been illustrated by birefringence dispersion mapping in gamma irradiated LiNbO₃ wafers.

Citation Download Citation

Andrzej L. Bajor "Testing optical materials by birefringence dispersion mapping", Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); https://doi.org/10.1117/12.497176

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