Iridium L3-edge and oxygen K-edge x-ray absorption spectroscopy of nanocrystalline iridium oxide thin films

A. Kuzmin; R. Kalendarev; J. Purans; D. Pailharey

doi:10.1117/12.517024

8 August 2003 Iridium L₃-edge and oxygen K-edge x-ray absorption spectroscopy of nanocrystalline iridium oxide thin films

A. Kuzmin, R. Kalendarev, J. Purans, D. Pailharey

Author Affiliations +

Proceedings Volume 5123, Advanced Optical Devices, Technologies, and Medical Applications; (2003) https://doi.org/10.1117/12.517024
Event: 2003 Chapter books, 2003, Bellingham, WA, United States

Abstract

Structural investigations of the short range order around iridium and oxygen ions in nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique, were performed by x-ray absorption spectroscopy. The Ir L₃-edge extended x-ray absorption fine structure and the O K-edge x-ray absorption near edge structure signals were measured at room temperature and analyzed within ab initio multiple-scattering and full-multiple-scattering approaches, respectively. The x-ray absorption spectroscopy results indicate the presence in the films of orderd regions - nanocrystals, having a size of about 10 angstrom and a structure rather close to that in crystalline iridium oxide IrO₂. Such evidence agrees well with observations by x-ray diffraction, suggesting that the thin films are x-ray amorphous.

Citation Download Citation

A. Kuzmin, R. Kalendarev, J. Purans, and D. Pailharey "Iridium L₃-edge and oxygen K-edge x-ray absorption spectroscopy of nanocrystalline iridium oxide thin films", Proc. SPIE 5123, Advanced Optical Devices, Technologies, and Medical Applications, (8 August 2003); https://doi.org/10.1117/12.517024

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