X-ray line spectropolarimetry as a new diagnostic of anisotropic plasma sources

Alla S. Shlyaptseva; Victor L. Kantsyrev; Nick D. Ouart; Dmitry A. Fedin; Safeia Hamasha; Stephanie B. Hansen

doi:10.1117/12.507909

7 January 2004 X-ray line spectropolarimetry as a new diagnostic of anisotropic plasma sources

Alla S. Shlyaptseva, Victor L. Kantsyrev, Nick D. Ouart, Dmitry A. Fedin, Safeia Hamasha, Stephanie B. Hansen

Proceedings Volume 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications; (2004) https://doi.org/10.1117/12.507909
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

The results of theoretical and experimental studies of anisotropic plasma sources are reported. They are based on x-ray line spectropolarimetry, a powerful new tool for investigating anisotropy of high-temperature plasmas. It is based on theoretical modeling of polarization-sensitive x-ray line spectra recorded simultaneously by two spectrometers with different sensitivities to polarization. The difference in these polarization-sensitive spectra is used to diagnose the parameters of anisotropic electron beams in plasmas. Theoretical predictions of polarization which cover a broad spectral range from K- to M-shell line radiation are presented. The results of Ti and Mo x-pinch polarization-sensitive experiments at UNR are overviewed. This diagnostic can be applied not only to x-pinches as demonstrated here but to laser-generated and other laboratory x-ray sources.

Citation Download Citation

Alla S. Shlyaptseva, Victor L. Kantsyrev, Nick D. Ouart, Dmitry A. Fedin, Safeia Hamasha, and Stephanie B. Hansen "X-ray line spectropolarimetry as a new diagnostic of anisotropic plasma sources", Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); https://doi.org/10.1117/12.507909

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