Paper
18 October 2004 How the size of a particle approaching dielectric interface influences its behavior
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Abstract
The influence of size of the trapped object on its position near the dielectric interface is studied experimentally. The trapping beam is reflected on a surface and creates weak standing wave component in resulting field distribution. This component causes unwanted jumps of the trapped particle, when the beam waist moves axially in the surface vicinity. Particles of different sizes are more and less influenced by the standing wave, respectively. The position of the trapped particle is measured with quadrant photodiode and photomultiplier tube at the same time.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Petr Jakl, Mojmir Sery, Jan Jezek, and Pavel Zemanek "How the size of a particle approaching dielectric interface influences its behavior", Proc. SPIE 5514, Optical Trapping and Optical Micromanipulation, (18 October 2004); https://doi.org/10.1117/12.557189
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Cited by 1 scholarly publication.
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KEYWORDS
Particles

Interfaces

Optical spheres

Microscopes

Dielectrics

Objectives

Optical tweezers

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