Moiré interferometry formulas for hard x-ray wavefront sensing

Timm Weitkamp; A. Diaz; Bernd Nohammer; Franz Pfeiffer; Marco Stampanoni; Eric Ziegler; Christian David

doi:10.1117/12.559695

18 October 2004 Moire interferometry formulas for hard x-ray wavefront sensing

Timm Weitkamp, A. Diaz, Bernd Nohammer, Franz Pfeiffer, Marco Stampanoni, Eric Ziegler, Christian David

Proceedings Volume 5533, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications II; (2004) https://doi.org/10.1117/12.559695
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

We derive mathematical relations for hard X-ray moire wavefront analysis with a grating interferometer. In particular, the first derivative of the wavefront phase profile and the local radius of curvature of the wavefront are related to the position and inclination of the observed moiré fringes.

Citation Download Citation

Timm Weitkamp, A. Diaz, Bernd Nohammer, Franz Pfeiffer, Marco Stampanoni, Eric Ziegler, and Christian David "Moire interferometry formulas for hard x-ray wavefront sensing", Proc. SPIE 5533, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications II, (18 October 2004); https://doi.org/10.1117/12.559695

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