Conceptual framework design for integrated visual inspection system

Yasuhiro Ueda; Shuhei Yamamoto; Tamon Iden; Masakazu Yanase; Yoshihide Shigeyama; Atsuyoshi Nakamura

doi:10.1117/12.580587

25 October 2004 Conceptual framework design for integrated visual inspection system

Yasuhiro Ueda, Shuhei Yamamoto, Tamon Iden, Masakazu Yanase, Yoshihide Shigeyama, Atsuyoshi Nakamura

Proceedings Volume 5603, Machine Vision and its Optomechatronic Applications; (2004) https://doi.org/10.1117/12.580587
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States

Abstract

This paper describes a framework for automatic generation of an image processing algorithm that consists of preprocessing, feature extraction, classification and algorithm evaluation modules based on machine learning. With a view to applying the generated algorithm to industrial visual inspection system, we intend to offer a framework model equipped with the below-mentioned features. Also, we want to report on the experimental result of the offered model. 1.Automatically generate by machine learning an image processing algorithm to extract regions that have same characteristics as specified by users. 2.Generate in particular a high-precision image processing algorithm, improving the level of statistical separation between true and false defects that may cause a deterioration factor in classification accuracy. 3.Optimize an image improving filter sequence in preprocessing modules by means of GA (Genetic Algorithm).

Citation Download Citation

Yasuhiro Ueda, Shuhei Yamamoto, Tamon Iden, Masakazu Yanase, Yoshihide Shigeyama, and Atsuyoshi Nakamura "Conceptual framework design for integrated visual inspection system", Proc. SPIE 5603, Machine Vision and its Optomechatronic Applications, (25 October 2004); https://doi.org/10.1117/12.580587

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