Annular subaperture interferometric testing technique for large aspheric surfaces

Xi Hou; Fan Wu; Shibin Wu; Qiang Chen

doi:10.1117/12.570188

10 February 2005 Annular subaperture interferometric testing technique for large aspheric surfaces

Xi Hou, Fan Wu, Shibin Wu, Qiang Chen

Proceedings Volume 5638, Optical Design and Testing II; (2005) https://doi.org/10.1117/12.570188
Event: Photonics Asia, 2004, Beijing, China

Abstract

A new method to test large aspheric surface by using Annular Sub-aperture Interferometric Testing (ASIT) is described in this paper. It solves the two main difficulties, which are manufacture difficulty and high cost of auxiliary elements (optics compensator, CGH, large reflector) used generally in testing the large aspheric mirror. The method reduces departure between the reference wavefront and tested wavefront to the measurement range of the interferometer by testing annular subaperture of aspheric surface, which makes reference wavefronts with different curvature radius match corresponding annular subaperture, then sews all sub-aperture datum together with a suitable algorithm to get the whole information of the surface. A stitching mathematics model is provided. The feasibility of the technique has been demonstrated by comparing test results from an autocollimation test and ASIT of an 152-mm diameter paraboloidal mirror. This method extends the dynamic range of interferometric measurements, by which the large, fast aspheric surface can be directly tested without additional optical elements.

Citation Download Citation

Xi Hou, Fan Wu, Shibin Wu, and Qiang Chen "Annular subaperture interferometric testing technique for large aspheric surfaces", Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); https://doi.org/10.1117/12.570188

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