Array scanner as microdensitometer surrogate: a deal with the devil or… a great deal?

Donald R. Williams

doi:10.1117/12.597085

17 January 2005 Array scanner as microdensitometer surrogate: a deal with the devil or . . . a great deal?

Donald R. Williams

Proceedings Volume 5668, Image Quality and System Performance II; (2005) https://doi.org/10.1117/12.597085
Event: Electronic Imaging 2005, 2005, San Jose, California, United States

Abstract

Inexpensive and easy-to-use linear and area-array scanners have frequently substituted as densitometers for low-frequency (i.e., large-area) hard copy image metrology. Increasingly, they are also being tasked for high spatial frequency, image microstructure metrology, which is reserved for high-performance microdensitometers that use microscope optics, photomultiplier tubes (PMT), and log amps. It is hard to resist their adoption for such use though, given the convenience level. Their high speed, large scan areas, auto-focus, discomfiting low cost, and low operator skill requirements makes one question if their use for such purpose is somehow too good to be true. To confidently judge their limitations requires a comprehensive signal and noise spatial frequency performance evaluation with respect to available driver options. This paper will outline and demonstrate evaluation techniques that use existing ISO metrology standards for modulation transfer function (MTF), noise, and dynamic range with a comparison to a Photometric Data Systems (PDS) microdensitometer

Citation Download Citation

Donald R. Williams "Array scanner as microdensitometer surrogate: a deal with the devil or . . . a great deal?", Proc. SPIE 5668, Image Quality and System Performance II, (17 January 2005); https://doi.org/10.1117/12.597085

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