CCD Charge Collection Efficiency And The Photon Transfer Technique

James Janesick; Kenneth Klaasen; Tom Elliott

doi:10.1117/12.950297

11 December 1985 CCD Charge Collection Efficiency And The Photon Transfer Technique

James Janesick, Kenneth Klaasen, Tom Elliott

Proceedings Volume 0570, Solid-State Imaging Arrays; (1985) https://doi.org/10.1117/12.950297
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

The charge-coupled device (CCD) has shown unprecendented performance as a photon detector in the areas of spectral response, charge transfer and readout noise. Recent experience indicates, however, that the full potential for the CCD's charge collection efficiency (CCE) lies well beyond that which is realized in currently available devices. In this paper, we present a definition of CCE performance and introduce a standard test tool (the photon transfer technique) for measuring and optimizing this important COD parameter. We compare CCE characteristics for different types of CODs, discuss the primary limitations in achieving high CCE performance, and outline the prospects for future improvement.

Citation Download Citation

James Janesick, Kenneth Klaasen, and Tom Elliott "CCD Charge Collection Efficiency And The Photon Transfer Technique", Proc. SPIE 0570, Solid-State Imaging Arrays, (11 December 1985); https://doi.org/10.1117/12.950297

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available