Measurement of linewidth enhancement factor of different semiconductor lasers in operating conditions

Guido Giuliani; Silvano Donati; Wolfgang Elsässer

doi:10.1117/12.665178

14 April 2006 Measurement of linewidth enhancement factor of different semiconductor lasers in operating conditions

Guido Giuliani, Silvano Donati, Wolfgang Elsässer

Proceedings Volume 6184, Semiconductor Lasers and Laser Dynamics II; 61841D (2006) https://doi.org/10.1117/12.665178
Event: SPIE Photonics Europe, 2006, Strasbourg, France

Abstract

We apply the self-mixing method for the measurement of the linewidth enhancement factor of several types of semiconductor lasers. The α-factor value above threshold is determined by analysing the small perturbations that occur to the laser when it is subjected to moderate optical feedback, relying on the well-known Lang-Kobayashi equations. The method is applied to Fabry-Perot, VCSEL, External Cavity Laser (ECL), DFB, Quantum Cascade Laser. It is found that for some lasers the α-factor varies with the emitted power, and these variations can be correlated with variations in the laser linewidth.

Citation Download Citation

Guido Giuliani, Silvano Donati, and Wolfgang Elsässer "Measurement of linewidth enhancement factor of different semiconductor lasers in operating conditions", Proc. SPIE 6184, Semiconductor Lasers and Laser Dynamics II, 61841D (14 April 2006); https://doi.org/10.1117/12.665178

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