Paper
29 May 2007 A new simple algorithm for image processing in Shack-Hartmann wavefront sensing
Author Affiliations +
Proceedings Volume 6356, Eighth International Conference on Quality Control by Artificial Vision; 63560Z (2007) https://doi.org/10.1117/12.736747
Event: Eighth International Conference on Quality Control by Artificial Vision, 2007, Le Creusot, France
Abstract
Quality testing of optics which is used in laboratories is one of the most important tasks and many procedures are proposed and used. These testing procedures are based on measurement of reflecting laser wavefront from optical component surfaces. By using the Shack-Hartmann method, we can measure a simple curved laser beam wavefront. For achieving this, firstly we reduce optical noise which may disturb our optical data. We improved peak location and sum location algorithms to introduce a simple new algorithm, based on adaptive thresholding. The proposed algorithm scans the image to identify the approximate location of focal spots by looking for local optical centers on CCD screen.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. D. Kashani, B. Ghafary, and S. B. Shokouhi "A new simple algorithm for image processing in Shack-Hartmann wavefront sensing", Proc. SPIE 6356, Eighth International Conference on Quality Control by Artificial Vision, 63560Z (29 May 2007); https://doi.org/10.1117/12.736747
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KEYWORDS
Wavefronts

Image processing

Wavefront sensors

Optical testing

Zernike polynomials

Spherical lenses

Charge-coupled devices

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