Paper
23 December 1986 Evolution Of Surface Roughness And Scatter In Evaporated Zirconia/Silica Multilayer Coatings
R E Klinger, P Swab
Author Affiliations +
Abstract
Problems of light scattering in multilayer dielectric thin films arise from non-uniform variations in optical indices. The purpose of this work was to evaluate the surface roughness and interfaces in zirconia/silica multilayers with respect to scattering. Scatter and surface roughness were evaluated with angular resolved scatterometry (at 633 nm) and stylus profilometry. The multilayer thin film interfaces and growth morphologies were characterized with transmission electron microscopy using thin cross sections prepared by ultra-microtomy. Multilayer designs made of thick zirconia layers showed both a higher scattered intensity and scattering at higher angles than those designs composed of thinner zirconia layers. Stylus profilometry data agreed with this trend, indicating that surface roughness is determined more by the zirconia layer thickness than by the number of layers. Transmission electron microscopy (TEM) provided an explanation for this behavior. Zirconia was observed to nucleate and form a vertical columnar microstructure on silica from which evolved a coarse, dendritic growth morphology. The silica, on the other hand, seemed to moderate the contribution of the zirconia microstructure to the multilayer surface texture.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R E Klinger and P Swab "Evolution Of Surface Roughness And Scatter In Evaporated Zirconia/Silica Multilayer Coatings", Proc. SPIE 0678, Optical Thin Films II: New Developments, (23 December 1986); https://doi.org/10.1117/12.939537
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications and 9 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Zirconium dioxide

Multilayers

Silica

Surface roughness

Scattering

Transmission electron microscopy

Optical coatings

Back to Top