Paper
12 August 1986 X-Ray Photoelectron Spectroscopy (XPS) Applications Using Microfocused X-Rays
Robert Chaney, Robert Cormia, Ruth Siordia
Author Affiliations +
Abstract
A focusing quartz crystal monochromator system. has been developed that provides a bright X-ray spot at 1486.6ev. The X-ray spot size may he varied from one-hundred fifty (150) to one-thousand (1000) microns in four (4) steps. The X-ray system is combined with a high. performance electron lens that collects greater than five (5) percent of the photoemitted electrons and passes them into a hemispherical capacitor energy analyzer. The electrons are detected at the exit plane with a two (2) dimensional position sensitivity detector. Using this system, XPS has been carried out on a wide variety of practical samples. We will provide a brief review of the system, design followed by examples of the solution to unique problems. Samples which have been CLosen for discussion include: Crash Zone on a Winchester Disk An interocular Lens . Single 5 micron Carbon. Fiber Plasma Modified Polymeric Say The unique benefits of a focused. source with high energy resolution will also be discussed.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert Chaney, Robert Cormia, and Ruth Siordia "X-Ray Photoelectron Spectroscopy (XPS) Applications Using Microfocused X-Rays", Proc. SPIE 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments, (12 August 1986); https://doi.org/10.1117/12.936604
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Cited by 1 scholarly publication.
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KEYWORDS
X-rays

Carbon

Monochromators

Sensors

Crystals

Contamination

Head

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