Paper
26 March 2008 Anti-reflective coating for multipatterning lithography
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Abstract
New bottom anti-reflective coatings (BARCs) have been developed that can be incorporated into multiple patterning schemes utilizing scanner-track-only processes. The BARCs have modifiable optical properties and can be removed during the resist development step. Several dual patterning schemes were investigated for trench printing. The most promising process produced 110 nm trenches with approximately 1:1 space ratios. The etch characteristics of these BARCs under fluorinated and oxygenated gases were determined.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Douglas J. Guerrero, Steve Gibbons, Joyce Lowes, and Ramil Mercado "Anti-reflective coating for multipatterning lithography", Proc. SPIE 6923, Advances in Resist Materials and Processing Technology XXV, 69230X (26 March 2008); https://doi.org/10.1117/12.772827
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CITATIONS
Cited by 1 scholarly publication and 8 patents.
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KEYWORDS
Photoresist processing

Etching

Image processing

Optical lithography

Semiconducting wafers

Oxygen

Argon

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