Paper
24 July 2008 Application of double-sided silicon strip detectors to Compton cameras
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Abstract
We have developed a Compton camera with a double-sided silicon strip detector (DSSD) for hard X-ray and gamma-ray observation. Using a DSSD as a scatter detector of the Compton camera, we achieved high angular resolution of 3.4° at 511 keV. Through the imaging of various samples such as two-dimentional array sources and a diffuse source, the wide field-of-view (~ 100°) and the high spatial resolution (at least 20 mm at a distance of 60 mm from the DSSD) of the camera were confirmed. Furthermore, using the List-Mode Maximum-Likelihood Expectation-Maximization method, the camera can resolve an interval of 3 mm at a distance of 30 mm from the DSSD.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroyuki Aono, Shin'ichiro Takeda, Shin-nosuke Ishikawa, Hirokazu Odaka, Motohide Kokubun, Shin Watanabe, Tadayuki Takahashi, Kazuhiro Nakazawa, Sho Okuyama, Hiroyasu Tajima, Yasushi Fukazawa, and Naoki Kawachi "Application of double-sided silicon strip detectors to Compton cameras", Proc. SPIE 7021, High Energy, Optical, and Infrared Detectors for Astronomy III, 70211G (24 July 2008); https://doi.org/10.1117/12.788784
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KEYWORDS
Cameras

Sensors

Spatial resolution

Deconvolution

Doppler effect

Silicon

Monte Carlo methods

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