Paper
11 August 2008 Gaussian-like shaping of coherent synchrotron x-rays: 3D diffraction at a 90-degree Bragg reflection
Andrei Y. Nikulin, Alexei Y. Souvorov
Author Affiliations +
Abstract
Gaussian-like shaping of the forward-diffracted intensity was observed from an initially rectangular cross-section of coherent x-rays. The effect occurs when a wavelength inside a crystal exactly matches the period of atomic net planes lying perpendicular to the incident beam. The transmitted peak intensity rose when the lateral width of the rectangular-shaped incident beam increased. The transmitted intensity profile spatially was significantly narrower than that of the incident beam size. The observations showed that, unlike in all other x-ray diffraction experiments, coherent and incoherent x-rays produced different dependences of the peak intensity and its width on the incident beam size.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrei Y. Nikulin and Alexei Y. Souvorov "Gaussian-like shaping of coherent synchrotron x-rays: 3D diffraction at a 90-degree Bragg reflection", Proc. SPIE 7057, The Nature of Light: Light in Nature II, 705702 (11 August 2008); https://doi.org/10.1117/12.795954
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KEYWORDS
X-rays

Crystals

Silicon

Diffraction

X-ray diffraction

Reflection

Sensors

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