A theoretical study of two-dimensional point focusing by two multilayer Laue lenses

Hanfei Yan; Jorg Maser; Hyon Chol Kang; Albert Macrander; Brian Stephenson

doi:10.1117/12.795721

3 September 2008 A theoretical study of two-dimensional point focusing by two multilayer Laue lenses

Hanfei Yan, Jorg Maser, Hyon Chol Kang, Albert Macrander, Brian Stephenson

Proceedings Volume 7077, Advances in X-Ray/EUV Optics and Components III; 70770Q (2008) https://doi.org/10.1117/12.795721
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Hard x-ray point focusing by two crossed multilayer Laue lenses is studied using a full-wave modeling approach. This study shows that for a small numerical aperture, the two consecutive diffraction processes can be decoupled into two independent ones in respective directions. Using this theoretical tool, we investigate adverse effects of various misalignments on the 2D focus profile and discuss the tolerance to them. We also derive simple expressions that describe the required alignment accuracy.

Citation Download Citation

Hanfei Yan, Jorg Maser, Hyon Chol Kang, Albert Macrander, and Brian Stephenson "A theoretical study of two-dimensional point focusing by two multilayer Laue lenses", Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70770Q (3 September 2008); https://doi.org/10.1117/12.795721

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