Validity of a fully coherent field model for in-line x-ray phase imaging

Adam M. Zysk; Miles N. Wernick; Mark A. Anastasio

doi:10.1117/12.793872

17 September 2008 Validity of a fully coherent field model for in-line x-ray phase imaging

Adam M. Zysk, Miles N. Wernick, Mark A. Anastasio

Proceedings Volume 7078, Developments in X-Ray Tomography VI; 70781A (2008) https://doi.org/10.1117/12.793872
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Accurate models that describe the propagation of partially coherent wave fields and their interaction with refractive index inhomogeneities within a sample are required to optimally design X-ray phase-contrast imaging systems. Several methods have been proposed for the direct propagation of the second-order statistical properties of a wave field. One method, which has been demonstrated for x-ray microscopy, employs a single eikonal for propagation, approximating the phase by an average over the temporal Fourier components of the field. We have revisited this method by use of a coherent mode model from classic coherence theory. Our analysis produces a variant of the transport of intensity equation for partially coherent wave fields.

Citation Download Citation

Adam M. Zysk, Miles N. Wernick, and Mark A. Anastasio "Validity of a fully coherent field model for in-line x-ray phase imaging", Proc. SPIE 7078, Developments in X-Ray Tomography VI, 70781A (17 September 2008); https://doi.org/10.1117/12.793872

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