Methodology for accurate multi-spectral signature measurement

Michael Y. Engel; Adam D. Devir; Ilan Mendelewicz

doi:10.1117/12.800285

2 October 2008 Methodology for accurate multi-spectral signature measurement

Michael Y. Engel, Adam D. Devir, Ilan Mendelewicz

Proceedings Volume 7113, Electro-Optical and Infrared Systems: Technology and Applications V; 711312 (2008) https://doi.org/10.1117/12.800285
Event: SPIE Security + Defence, 2008, Cardiff, Wales, United Kingdom

Abstract

Transient multi-spectral signatures have become a basis for the development of IRST (IR Search and Track) and automatic target acquisition systems. Multi-spectral signatures must be measured in absolute physical system-independent units in order to be valid for use in system design. The required data comprise a temporal profile of the radiant intensity (or radiance) emitted by the target at the target plane in the required spectral bands. The methodology for converting electronic output signal from a multi spectral radiometer - volts - into the radiant intensity of the object is a complex procedure. In this procedure the following parameters have to be taken into account: the nature of the measured target (gray body or molecular emission spectra), the spectral filter, the detector responsivity, the frequency response and rise time and all ambient parameters such as atmospheric attenuation and solar radiance. Avoiding the correct analysis procedure, leads to erroneous data which may mislead users of multi-spectral signatures. This paper describes the appropriate methodology for multi-spectral signature measurement, analysis and factors that influence the accuracy of the resultant data.

Citation Download Citation

Michael Y. Engel, Adam D. Devir, and Ilan Mendelewicz "Methodology for accurate multi-spectral signature measurement", Proc. SPIE 7113, Electro-Optical and Infrared Systems: Technology and Applications V, 711312 (2 October 2008); https://doi.org/10.1117/12.800285

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