The combined influence of low-flux electrons irradiation and weak magnetic field on silicon microhardness

Yuriy I. Golovin; Alexander A. Dmitrievskiy; Nadezhda Yu. Efremova; Vladimir M. Vasyukov

doi:10.1117/12.836914

17 June 2009 The combined influence of low-flux electrons irradiation and weak magnetic field on silicon microhardness

Yuriy I. Golovin, Alexander A. Dmitrievskiy, Nadezhda Yu. Efremova, Vladimir M. Vasyukov

Proceedings Volume 7377, Twelfth International Workshop on Nanodesign Technology and Computer Simulations; 73770M (2009) https://doi.org/10.1117/12.836914
Event: Nano-Design, Technology, Computer Simulations, 2008, Minsk, Belarus

Abstract

The combined influence of low-flux electron irradiation and weak magnetic and electric fields on silicon single-crystal microhardness was investigated. It is shown that the microhardness is more sensitive to low-doses effects irradiation than conductivity. The effect of magnetic and electric fields on the process of secondary radiation defects generation was revealed.

Citation Download Citation

Yuriy I. Golovin, Alexander A. Dmitrievskiy, Nadezhda Yu. Efremova, and Vladimir M. Vasyukov "The combined influence of low-flux electrons irradiation and weak magnetic field on silicon microhardness", Proc. SPIE 7377, Twelfth International Workshop on Nanodesign Technology and Computer Simulations, 73770M (17 June 2009); https://doi.org/10.1117/12.836914

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