Inferring the orientation of texture from polarization parameters

Hannah Noble; Wai-Sze Lam; Russell A. Chipman

doi:10.1117/12.828261

11 August 2009 Inferring the orientation of texture from polarization parameters

Hannah Noble, Wai-Sze Lam, Russell A. Chipman

Proceedings Volume 7461, Polarization Science and Remote Sensing IV; 746109 (2009) https://doi.org/10.1117/12.828261
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

It is shown that once the diffusely scattered polarization properties are calibrated, the texture orientation can be calculated directly from diattenuation and retardance. Polarization scattering properties are studied for a rough aluminum surface with one-dimensional rough texture and well-defined orientation. Functions of Mueller matrix elements related to sample orientation about the normal via the arctangent function are investigated. The Mueller matrix bidirectional reflectance distribution function is measured for a linearly sanded aluminum sample. Sinusoidal fits to the Mueller matrix show that the angular orientation of the data can be recovered explicitly from its properties.

Citation Download Citation

Hannah Noble, Wai-Sze Lam, and Russell A. Chipman "Inferring the orientation of texture from polarization parameters", Proc. SPIE 7461, Polarization Science and Remote Sensing IV, 746109 (11 August 2009); https://doi.org/10.1117/12.828261

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