Paper
18 January 2010 Estimating the noise influence on recovering reflectances
Author Affiliations +
Proceedings Volume 7529, Image Quality and System Performance VII; 75290M (2010) https://doi.org/10.1117/12.840244
Event: IS&T/SPIE Electronic Imaging, 2010, San Jose, California, United States
Abstract
The evaluation of the noise present in the image acquisition system and the influence of the noise is essential to image acquisition. However the mean square errors (MSE) is not divided into two terms, i.e., the noise independent MSE (MSEfree) and noise dependent MSE (MSEnoise) were not discussed separately before. The MSEfree depends on the spectral characteristics of a set of sensors, illuminations and reflectances of imaged objects and the MSEfree arises in the noise free case, however MSEnoise originates from the noise present image acquisition system. One of the authors (N.S.) already proposed a model to separate the MSE into the two factors and also proposed a model to estimate noise variance present in image acquisition systems. By the use of this model, we succeeded in the expression of the MSEnoise as a function of the noise variance and showed that the experimental results agreed fairly well with the expression when the Wiener estimation was used for the recovery. The present paper shows the extended expression for the influence of the system noise on the MSEnoise and the experimental results to show the trustworthiness of the expression for the regression model, Imai-Berns model and finite dimensional linear model.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mikiya Hironaga and Noriyuki Shimano "Estimating the noise influence on recovering reflectances", Proc. SPIE 7529, Image Quality and System Performance VII, 75290M (18 January 2010); https://doi.org/10.1117/12.840244
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KEYWORDS
Sensors

Image acquisition

Nickel

Cameras

Reflectivity

Mathematical modeling

Systems modeling

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