Instrumentation for beam profiling in the terahertz regime

Martin S. Heimbeck; Henry O. Everitt; Kent Taylor; Carys Davis; Eric Hamilton; David E. Thomas; Patrick J. Reardon; Jeffrey Hesler

doi:10.1117/12.849932

26 April 2010 Instrumentation for beam profiling in the terahertz regime

Martin S. Heimbeck, Henry O. Everitt, Kent Taylor, Carys Davis, Eric Hamilton, David E. Thomas, Patrick J. Reardon, Jeffrey Hesler

Author Affiliations +

Proceedings Volume 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense; 76710J (2010) https://doi.org/10.1117/12.849932
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

The standalone, portable Terahertz (THz) Imaging Profiler Array (TIPA) based on an Offner Relay design has been constructed as a THz beam profiler and multispectral imager. It integrates a solid-state detector technology (Schottky Diodes) that can be configured in an array to cover the frequency range from 0.60 to 0.90 THz. The reconfigurable 16 element Schottky diode detector array is utilized along with imaging and scanning mirror modules and system control hardware and software to produce high spatial or temporal beam profiles of THz beams. Images of THz source profiles are presented along with THz images of relevant targets. Potential applications are discussed.

Citation Download Citation

Martin S. Heimbeck, Henry O. Everitt, Kent Taylor, Carys Davis, Eric Hamilton, David E. Thomas, Patrick J. Reardon, and Jeffrey Hesler "Instrumentation for beam profiling in the terahertz regime", Proc. SPIE 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense, 76710J (26 April 2010); https://doi.org/10.1117/12.849932

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