Paper
20 April 2010 Multi-frequency and polarimetric measurements of perturbed water surface microwave reflective and emissive characteristics by C-, and Ku-band combined scatterometric-radiometric systems
Artashes K. Arakelyan, Astghik K. Hambaryan, Vardan K. Hambaryan, Vanik V. Karyan, Mushegh R. Manukyan, Melanya L. Grigoryan, Gagik G. Hovhannisyan, Arsen A. Arakelyan, Sargis A. Darbinyan
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Abstract
In this paper the results of simultaneous and spatially coincident, multi-frequency, polarimetric, spatio-temporally collocated measurements of waved pool water surface microwave reflective (radar backscattering coefficient) and emissive (brightness temperature) characteristics angular dependences at 5.6GHz and 15GHz will be represented. Angular measurements were carried out for various water surface roughness parameters at clear air, cloudy and rain conditions. For these measurements C-, and Ku-band, polarimetric, combined scatterometric-radiometric systems were used, set jointly on a mobile buggy moving along the measuring platform. Structures, operational features and the main technical characteristics of the utilized systems are presented too. The paper has an aim as well to attract attention of interested researchers and to invite them to perform their own or joint researches using available devices and facilities.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Artashes K. Arakelyan, Astghik K. Hambaryan, Vardan K. Hambaryan, Vanik V. Karyan, Mushegh R. Manukyan, Melanya L. Grigoryan, Gagik G. Hovhannisyan, Arsen A. Arakelyan, and Sargis A. Darbinyan "Multi-frequency and polarimetric measurements of perturbed water surface microwave reflective and emissive characteristics by C-, and Ku-band combined scatterometric-radiometric systems", Proc. SPIE 7678, Ocean Sensing and Monitoring II, 76780C (20 April 2010); https://doi.org/10.1117/12.848732
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Cited by 2 scholarly publications and 4 patents.
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KEYWORDS
Radar

Calibration

Microwave radiation

Polarization

Reflectivity

Temperature metrology

Clouds

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