Reliability evaluation on 100W QCW-AlGaAs/GaAs 808nm cm-bars

Guoguang Lu; Yun Huang; Yungfei En

doi:10.1117/12.871540

21 July 2010 Reliability evaluation on 100W QCW-AlGaAs/GaAs 808nm cm-bars

Guoguang Lu, Yun Huang, Yungfei En

Proceedings Volume 7749, 2010 International Conference on Display and Photonics; 77490W (2010) https://doi.org/10.1117/12.871540
Event: 2010 International Conference on Display and Photonics, 2010, Nanjing, China

Abstract

Degradation performance and lifetimes of high power laser diodes are important issues for laser manufacturers and end users. To fully understand these issues we have set up a computer controlled diode array reliability experiment which can automated monitor the laser bars 24 hours a day. Subsequent two different temperatures aging tests were completed, according to the aging results we obtained an acceleration factor 1.88 of resulting in a thermal activation energy of E_a=0.21eV. Finally, the detailed failure analysis for the failed devices and its influence on reliability were reported on this paper.

Citation Download Citation

Guoguang Lu, Yun Huang, and Yungfei En "Reliability evaluation on 100W QCW-AlGaAs/GaAs 808nm cm-bars", Proc. SPIE 7749, 2010 International Conference on Display and Photonics, 77490W (21 July 2010); https://doi.org/10.1117/12.871540

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