Propagation of a Gaussian beam through a stack of positive and negative refractive index materials

Anjan Ghosh; Pramode Verma; Partha P. Banerjee; Rola Aylo

doi:10.1117/12.861948

10 September 2010 Propagation of a Gaussian beam through a stack of positive and negative refractive index materials

Anjan Ghosh, Pramode Verma, Partha P. Banerjee, Rola Aylo

Proceedings Volume 7754, Metamaterials: Fundamentals and Applications III; 775415 (2010) https://doi.org/10.1117/12.861948
Event: SPIE NanoScience + Engineering, 2010, San Diego, California, United States

Abstract

Propagation of a monochromatic Gaussian beam through a stack of alternating layers of positive-refractive-index dielectrics and negative-refractive-index metamaterials is analyzed using paraxial ray-optics approach. Expressions for the change of the spot-size of the Gaussian beam are derived. Sensors for measuring parameters that affect the thickness or refractive index of the metamaterials can be developed based on the change of the spot-size.

Citation Download Citation

Anjan Ghosh, Pramode Verma, Partha P. Banerjee, and Rola Aylo "Propagation of a Gaussian beam through a stack of positive and negative refractive index materials", Proc. SPIE 7754, Metamaterials: Fundamentals and Applications III, 775415 (10 September 2010); https://doi.org/10.1117/12.861948

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