Paper
2 September 2010 Optical material characterization through BSDF measurement and analysis
Author Affiliations +
Abstract
The optical scattering signature and the absorbance of a material are of interest in a variety of engineering applications, particularly for those pertaining to optical remote sensing. The John Hopkins University Applied Physics Laboratory has developed an experimental capability to measure in-plane bidirectional scattering distribution functions to retrieve optical properties of materials. These measurements are supported at high angular resolution with wavelengths that span the ultra-violet to the long-wave infrared. Models have been developed to fit Lambertian, diffuse, near-specular, and specular scattering at a range of incident angles. Useful material properties can then be determined through analysis of the modeled BSDF. Optical characterization results are shown for a variety of materials, including paints, metals, optical windows, and leaves.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrea M. Brown, Daniel V. Hahn, Michael E. Thomas, David M. Brown, and Jessica Makowski "Optical material characterization through BSDF measurement and analysis", Proc. SPIE 7792, Reflection, Scattering, and Diffraction from Surfaces II, 779211 (2 September 2010); https://doi.org/10.1117/12.861499
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Cited by 7 scholarly publications.
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KEYWORDS
Bidirectional reflectance transmission function

Reflectivity

Scattering

Sensors

Reflection

Visible radiation

Applied physics

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