Process analytical applications in the mid-infrared

S. Lundqvist; P. Kluczynski

doi:10.1117/12.871571

24 January 2011 Process analytical applications in the mid-infrared

S. Lundqvist, P. Kluczynski

Proceedings Volume 7945, Quantum Sensing and Nanophotonic Devices VIII; 79450N (2011) https://doi.org/10.1117/12.871571
Event: SPIE OPTO, 2011, San Francisco, California, United States

Abstract

A review of applications for tunable diode laser spectroscopy (TDLS) instrumentation in process analytics is presented. We have investigated applications in olefin production suitable for TDLS instrumentation. The possibility to detect acetylene impurities in different hydrocarbon backgrounds was investigated by TDLS in the 3 micron wavelength region using novel GaInAsSb/AlGaAsSb DFB lasers. The performance of the TDLS instrument for detection of acetylene impurities in pure ethylene and in a gas matrix typical of a hydrogenating reactor was investigated more in detail. Experiments with in-situ measurements of hydrocarbons in an industrial environment using a modified Siemens TDLS instrument are also discussed.

Citation Download Citation

S. Lundqvist and P. Kluczynski "Process analytical applications in the mid-infrared", Proc. SPIE 7945, Quantum Sensing and Nanophotonic Devices VIII, 79450N (24 January 2011); https://doi.org/10.1117/12.871571

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