Paper
1 March 2011 Development of a polarization resolved mid-IR near-field microscope
Zohreh Sedaghat, Aurelien Bruyant, Michel Kazan, Julien Vaillant, Sylvain Blaize, Névine Rochat, Nicolas Chevalier, Enric Garcia-Caurel, Pierre Morin, Pascal Royer
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Abstract
We have developed a scattering-type microscope operating in the mid-IR range with a polarization analysis. The experimental development and the operation of the microscope are described. The optical system can provide for each pixel of the image a matrix similar to a Jones matrix. Examples of polarization resolved images obtained on a SiO2/Si surface grating with a tungsten probe are shown and a high optical resolution is clearly demonstrated through the imaging of submicron metallic lines.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zohreh Sedaghat, Aurelien Bruyant, Michel Kazan, Julien Vaillant, Sylvain Blaize, Névine Rochat, Nicolas Chevalier, Enric Garcia-Caurel, Pierre Morin, and Pascal Royer "Development of a polarization resolved mid-IR near-field microscope", Proc. SPIE 7946, Photonic and Phononic Properties of Engineered Nanostructures, 79461N (1 March 2011); https://doi.org/10.1117/12.874932
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Polarization

Microscopes

Mid-IR

Near field scanning optical microscopy

Tungsten

Near field

Silicon

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