Next-generation ionomer encapsulants for thin film technology

Robin Czyzewicz; C. Anthony Smith

doi:10.1117/12.894257

21 September 2011 Next-generation ionomer encapsulants for thin film technology

Robin Czyzewicz, C. Anthony Smith

Proceedings Volume 8112, Reliability of Photovoltaic Cells, Modules, Components, and Systems IV; 81120F (2011) https://doi.org/10.1117/12.894257
Event: SPIE Solar Energy + Technology, 2011, San Diego, California, United States

Abstract

The characteristic properties of newly developed ionomer-based encapsulants are highlighted along with an in-depth analysis of moisture ingress, electrical and mechanical properties. The mechanical properties of these encapsulants with their high stiffness and strength have been found to allow the use of thinner glass and a possible shift from tempered to annealed glass. Lower-cost mounting options may be explored through full-module stress/deflection measurement capability and competencies developed in world-class finite-element modeling of system parameters. The superior electrical and moisture properties may allow modules to be produced without the use of an additional edge seal. These new materials have improved melt flow properties when compared to other encapsulant families such as EVA or PVB. This allows for faster processing which reduces production cost by shortening the lamination cycle. During the lamination process the sheets show excellent dimensional stability and low shrinkage behavior; and there is no need for curing, thus energy costs are lower due to lower lamination temperature. As advancement of technology proceeds across the entire PV industry, next generation ionomer encapsulants have been developed to keep up with the pace.

Citation Download Citation

Robin Czyzewicz and C. Anthony Smith "Next-generation ionomer encapsulants for thin film technology", Proc. SPIE 8112, Reliability of Photovoltaic Cells, Modules, Components, and Systems IV, 81120F (21 September 2011); https://doi.org/10.1117/12.894257

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