The influence of refractive index profile on the numeric aperture in a double-layer large-core fiber

Weimin Sun; Haijiao Yu; Jinlai Xue; Yu Jiang; Yongjun Liu; Zongjun Huang; Jianzhong Zhang

doi:10.1117/12.907232

28 November 2011 The influence of refractive index profile on the numeric aperture in a double-layer large-core fiber

Weimin Sun, Haijiao Yu, Jinlai Xue, Yu Jiang, Yongjun Liu, Zongjun Huang, Jianzhong Zhang

Proceedings Volume 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology; 82020P (2011) https://doi.org/10.1117/12.907232
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China

Abstract

A special designed fiber with double layers of cores was investigated theoretically and experimentally. This fiber is widely used in astronomy to transform light from the telescope to the optical spectrum analyzer. The refractive index profile of this fiber was measured firstly. The testing result showed that the fiber has three layers of refractive index. A special layer of the highest refractive index is between the uniform general fiber core and the general low-refractive-index fiber cladding. This highest layer has higher local numeric aperture (NA), which can absorb more light when the incidence angle is little larger. A series of experiments have been done to prove that the NA is larger than normal fibers due to the higher-index layer. Two special incidence angles were measured respect to uniform and circle mode pattern.

Citation Download Citation

Weimin Sun, Haijiao Yu, Jinlai Xue, Yu Jiang, Yongjun Liu, Zongjun Huang, and Jianzhong Zhang "The influence of refractive index profile on the numeric aperture in a double-layer large-core fiber", Proc. SPIE 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology, 82020P (28 November 2011); https://doi.org/10.1117/12.907232

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