An experimental analysis of the real contact area between an electrical contact and a glass plane

Michael Down; Liudi Jiang; John W. McBride

doi:10.1117/12.2021355

22 June 2013 An experimental analysis of the real contact area between an electrical contact and a glass plane

Michael Down, Liudi Jiang, John W. McBride

Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 876914 (2013) https://doi.org/10.1117/12.2021355
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore

Abstract

The exact contact between two rough surfaces is usually estimated using statistical mathematics and surface analysis before and after contact has occurred. To date the majority of real contact and loaded surfaces has been theoretical or by numerical analyses. A method of analysing real contact area under various loads, by utilizing a con-contact laser surface profiler, allows direct measurement of contact area and deformation in terms of contact force and plane displacement between two surfaces. A laser performs a scan through a transparent flat side supported in a fixed position above the base. A test contact, mounted atop a spring and force sensor, and a screw support which moves into contact with the transparent surface. This paper presents the analysis of real contact area of various surfaces under various loads. The surfaces analysed are a pair of Au coated hemispherical contacts, one is a used Au to Au coated multi-walled carbon nanotubes surface, from a MEMS relay application, the other a new contact surface of the same configuration.

Citation Download Citation

Michael Down, Liudi Jiang, and John W. McBride "An experimental analysis of the real contact area between an electrical contact and a glass plane", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 876914 (22 June 2013); https://doi.org/10.1117/12.2021355

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KEYWORDS

Glasses

Gold

Statistical analysis

Sensors

Carbon nanotubes

Resistance

Microelectromechanical systems

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