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13 March 2013 A test sheet generating algorithm based on intelligent genetic algorithm and hierarchical planning (withdrawal notice)
Peipei Gu, Zhendong Niu, Xuting Chen, Wei Chen
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Proceedings Volume 8784, Fifth International Conference on Machine Vision (ICMV 2012): Algorithms, Pattern Recognition, and Basic Technologies; 87842Q (2013) https://doi.org/10.1117/12.2021235
Event: Fifth International Conference on Machine Vision (ICMV 12), 2012, Wuhan, China
Abstract
This paper was presented at the conference indicated above but was previously presented and published in an earlier SPIE proceedings volume. The paper has been withdrawn from Proc. SPIE 8784 by the publisher. The citation for the earlier paper is: Peipei Gu, Zhendong Niu, Xuting Chen, and Wei Chen, "A test sheet generating algorithm based on intelligent genetic algorithm and hierarchical planning," Proc. SPIE 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012), 83343S (May 1, 2012); DOI: http://dx.doi.org/10.1117/12.966822.
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Peipei Gu, Zhendong Niu, Xuting Chen, and Wei Chen "A test sheet generating algorithm based on intelligent genetic algorithm and hierarchical planning (withdrawal notice)", Proc. SPIE 8784, Fifth International Conference on Machine Vision (ICMV 2012): Algorithms, Pattern Recognition, and Basic Technologies, 87842Q (13 March 2013); https://doi.org/10.1117/12.2021235
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KEYWORDS
Genetic algorithms
Detection and tracking algorithms
Digital image processing
Machine vision
Pattern recognition
Current controlled current source
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