Paper
17 June 2013 Dynamic control of illumination beam phase profile in a scanning optical microscope
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Abstract
We propose a scanning optical microscope, for samples introducing spatially varying aberrations to the illumination beam. It is implemented with a microscope that has binary hologram based beam scanning mechanism where illumination beam phase profile is varied from pixel to pixel. Unlike a conventional scanning microscope, the scanning is achieved by the beam diffracted from a binary hologram written on the display panel of a liquid crystal spatial light modulator. The aberration correction is achieved without a separate wavefront sensor. For correcting the aberration in the illumination beam the signal is maximized by changing the shape of the binary hologram in terms of chosen Zernike mode coefficients.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Abhijit Das and Bosanta R. Boruah "Dynamic control of illumination beam phase profile in a scanning optical microscope", Proc. SPIE 8797, Advanced Microscopy Techniques III, 87970K (17 June 2013); https://doi.org/10.1117/12.2032672
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KEYWORDS
Holograms

Wavefronts

Binary data

Microscopes

Wavefront sensors

Cameras

Optical microscopes

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