Paper
7 March 2014 Processing and properties of arsenic trisulfide chalcogenide glasses for direct laser writing of 3D microstructures
Casey M. Schwarz, Henry E. Williams, Chris N. Grabill, Anna M. Lewis, Stephen M. Kuebler, Benn Gleason, Kathleen A. Richardson, Alexej Pogrebnyakov, Theresa S. Mayer, Christina Drake, Clara Rivero-Baleine
Author Affiliations +
Abstract
Arsenic trisulfide (As2S3) is a transparent material from ~620 nm to 11 μm with direct applications in sensors, photonic waveguides, and acousto-optics. As2S3 may be thermally deposited to form glassy films of molecular chalcogenide (ChG) clusters. It has been shown that linear and multi-photon exposure can be used to photo-pattern thermally deposited As2S3. Photo-exposure cross-links the film into a network solid. Treating the photo-patterned material with a polarsolvent removes the unexposed material leaving behind a structure that is a negative-tone replica of the photo-pattern. In this work, nano-structure arrays were photo-patterned in As2S3 films by multi-photon direct laser writing (DLW) and the resulting structure, morphology, and chemical composition were characterized and correlated with the conditions of the thermal deposition, patterned irradiation, and etch processing. Raman spectroscopy was used to characterize the chemical structure of the unexposed and photo-exposed material, and near infrared ellipsometry was used to measure the refractive index. Physical characterization including structure size and surface adhesion of nano-scale features is related to the processing conditions.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Casey M. Schwarz, Henry E. Williams, Chris N. Grabill, Anna M. Lewis, Stephen M. Kuebler, Benn Gleason, Kathleen A. Richardson, Alexej Pogrebnyakov, Theresa S. Mayer, Christina Drake, and Clara Rivero-Baleine "Processing and properties of arsenic trisulfide chalcogenide glasses for direct laser writing of 3D microstructures", Proc. SPIE 8974, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VII, 89740P (7 March 2014); https://doi.org/10.1117/12.2042809
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Cited by 5 scholarly publications.
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KEYWORDS
Etching

Ultraviolet radiation

Raman spectroscopy

Refractive index

Arsenic

Multiphoton lithography

Ellipsometry

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