Measurements Of X-Ray Fluorescence Yields Of Plastics By Photoexcitation

Robert G Hockaday

doi:10.1117/12.945493

11 July 1988 Measurements Of X-Ray Fluorescence Yields Of Plastics By Photoexcitation

Robert G Hockaday

Proceedings Volume 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements; (1988) https://doi.org/10.1117/12.945493
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

With the recent compilation of the low-energy x-ray photoabsorption and scattering factors, it has become more practical to determine low-energy x-ray fluorescence yields and to check the scattering cross sections of materials by x-ray photoexcitation. The x-ray fluorescence yield measurements of carbon in polypropylene, oxygen in mylar, and fluorine in polytetrafluorethylene (teflon), by Al x-ray photoexcitation will be presented. Also a comparison of calculated to observed Al Ka x-ray scattering from these plastics will be presented.

Citation Download Citation

Robert G Hockaday "Measurements Of X-Ray Fluorescence Yields Of Plastics By Photoexcitation", Proc. SPIE 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements, (11 July 1988); https://doi.org/10.1117/12.945493

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