Paper
22 September 2014 Contribution of the metrology to the study of laser induced damage with multiple longitudinal mode pulses
Author Affiliations +
Abstract
With the purpose of understanding nanosecond laser induced damage mechanisms when working with multiple longitudinal mode pulses, an accurate measurement of the temporal profiles is required. In this study, the use of a streak camera with a wide bandwidth is justified through the knowledge of the Nd:YAG spectral characteristics. A statistical and phenomenological analysis of multiple longitudinal modes intensity profiles is then performed through experiments and modeling. The resolution limitation of our photodiodes is also discussed.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Diaz, M. Chambonneau, R. Courchinoux, J. Luce, J.-Y. Natoli, and L. Lamaignère "Contribution of the metrology to the study of laser induced damage with multiple longitudinal mode pulses", Proc. SPIE 9238, Pacific Rim Laser Damage 2014: Optical Materials for High-Power Lasers, 92380I (22 September 2014); https://doi.org/10.1117/12.2073237
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photodiodes

Streak cameras

Laser induced damage

Metrology

Nd:YAG lasers

Frequency conversion

Spatial light modulators

Back to Top