Paper
14 February 2015 Measuring the engagement level of children for multiple intelligence test using Kinect
Dongjin Lee, Woo han Yun, Chan kyu Park, H. Yoon, Jaehong Kim, C. H. Park
Author Affiliations +
Proceedings Volume 9445, Seventh International Conference on Machine Vision (ICMV 2014); 944529 (2015) https://doi.org/10.1117/12.2181171
Event: Seventh International Conference on Machine Vision (ICMV 2014), 2014, Milan, Italy
Abstract
In this paper, we present an affect recognition system for measuring the engagement level of children using the Kinect while performing a multiple intelligence test on a computer. First of all, we recorded 12 children while solving the test and manually created a ground truth data for the engagement levels of each child. For a feature extraction, Kinect for Windows SDK provides support for a user segmentation and skeleton tracking so that we can get 3D joint positions of an upper-body skeleton of a child. After analyzing movement of children, the engagement level of children’s responses is classified into two classes: High or Low. We present the classification results using the proposed features and identify the significant features in measuring the engagement.
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Dongjin Lee, Woo han Yun, Chan kyu Park, H. Yoon, Jaehong Kim, and C. H. Park "Measuring the engagement level of children for multiple intelligence test using Kinect", Proc. SPIE 9445, Seventh International Conference on Machine Vision (ICMV 2014), 944529 (14 February 2015); https://doi.org/10.1117/12.2181171
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Cited by 4 scholarly publications.
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KEYWORDS
Feature extraction

Head

Sensors

Cameras

Computing systems

Motion analysis

RGB color model

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