Digital super-resolution microscopy using example-based algorithm

Shinji Ishikawa; Yoshio Hayasaki

doi:10.1117/12.2184826

22 June 2015 Digital super-resolution microscopy using example-based algorithm

Shinji Ishikawa, Yoshio Hayasaki

Proceedings Volume 9525, Optical Measurement Systems for Industrial Inspection IX; 952504 (2015) https://doi.org/10.1117/12.2184826
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

We propose a super-resolution microscopy with a confocal optical setup and an example-based algorithm. The example-based super-resolution algorithm was performed by an example database which is constructed by learning a lot of sets of a high-resolution patch and a low-resolution patch. The high-resolution patch is a part of the high-resolution image of an object model expressed in a computer, and the low-resolution patch is calculated from the high-resolution patch in consideration with a spatial property of an optical microscope. In the reconstruction process, a low-resolution image observed by the confocal optical setup with an image sensor is converted to the super-resolved high-resolution image selected by a pattern matching method from the example database. We demonstrate the adequate selection of the patch size and the weighting superposition method performs the super resolution with a low signal-to noise ratio.

Citation Download Citation

Shinji Ishikawa and Yoshio Hayasaki "Digital super-resolution microscopy using example-based algorithm", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 952504 (22 June 2015); https://doi.org/10.1117/12.2184826

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KEYWORDS

Lawrencium

Databases

Signal to noise ratio

Confocal microscopy

Image sensors

Reconstruction algorithms

Super resolution

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