New Method Of Contouring Using Digital Speckle Pattern Interferometry (DSPI)

A. R. Ganesan; R. S. Sirohi

doi:10.1117/12.947606

16 January 1989 New Method Of Contouring Using Digital Speckle Pattern Interferometry (DSPI)

A. R. Ganesan, R. S. Sirohi

Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947606
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States

Abstract

A new method of contouring 3-D objects in real-time is suggested. The technique makes use of Digital Speckle Pattern Interferometry (DSPI) alongwith an in-plane sensitive optical configuration. The contour interval can be varied in real-time by varying the tilt applied to the object. The variation of the contour interval with the tilt angle and the angle between the illumination beams is discussed. The decorrelation of speckle pattern due to tilt and consequently the disappearance of the fringes is also discussed. Experimental results have been presented for a variety of objects.

Citation Download Citation

A. R. Ganesan and R. S. Sirohi "New Method Of Contouring Using Digital Speckle Pattern Interferometry (DSPI)", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); https://doi.org/10.1117/12.947606

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