Paper
3 September 2015 Further development of imaging near-field scatterometer
Denise Uebeler, Lukas Pescoller, Cornelius Hahlweg
Author Affiliations +
Abstract
In continuation of last year’s paper on the use of near field imaging, which basically is a reflective shadowgraph method, for characterization of glossy surfaces like printed matter or laminated material, further developments are discussed. Beside the identification of several types of surfaces and related features, for which the method is applicable, several refinements are introduced. The theory of the method is extended, based on a mixed Fourier optical and geometrical approach, leading to rules of thumb for the resolution to be expected, giving a framework for design. Further, a refined experimental set-up is introduced. Variation of plane of focus and incident angle are used for separation of various the images of he layers of the surface under test, cross and parallel polarization techniques are applied. Finally, exemplary measurement results and examples are included.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Denise Uebeler, Lukas Pescoller, and Cornelius Hahlweg "Further development of imaging near-field scatterometer", Proc. SPIE 9579, Novel Optical Systems Design and Optimization XVIII, 95790C (3 September 2015); https://doi.org/10.1117/12.2188118
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Near field

Diffraction

System on a chip

Polarization

Decision support systems

Inspection

Imaging systems

RELATED CONTENT

Near-field imaging techniques for surface inspection
Proceedings of SPIE (September 12 2014)
CNN computer for high-speed visual inspection
Proceedings of SPIE (April 04 2001)
Modal analysis of a fused silica three port beam splitter...
Proceedings of SPIE (November 20 2012)
Micrometrology Of Thick Structures
Proceedings of SPIE (September 28 1989)

Back to Top