Line-scan spatially offset Raman spectroscopy for inspecting subsurface food safety and quality

Jianwei Qin; Kuanglin Chao; Moon S. Kim

doi:10.1117/12.2223746

17 May 2016 Line-scan spatially offset Raman spectroscopy for inspecting subsurface food safety and quality

Jianwei Qin, Kuanglin Chao, Moon S. Kim

Proceedings Volume 9864, Sensing for Agriculture and Food Quality and Safety VIII; 98640C (2016) https://doi.org/10.1117/12.2223746
Event: SPIE Commercial + Scientific Sensing and Imaging, 2016, Baltimore, MD, United States

Abstract

This paper presented a method for subsurface food inspection using a newly developed line-scan spatially offset Raman spectroscopy (SORS) technique. A 785 nm laser was used as a Raman excitation source. The line-shape SORS data was collected in a wavenumber range of 0–2815 cm^-1 using a detection module consisting of an imaging spectrograph and a CCD camera. A layered sample, which was created by placing a plastic sheet cut from the original container on top of cane sugar, was used to test the capability for subsurface food inspection. A whole set of SORS data was acquired in an offset range of 0–36 mm (two sides of the laser) with a spatial interval of 0.07 mm. Raman spectrum from the cane sugar under the plastic sheet was resolved using self-modeling mixture analysis algorithms, demonstrating the potential of the technique for authenticating foods and ingredients through packaging. The line-scan SORS measurement technique provides a new method for subsurface inspection of food safety and quality.

Citation Download Citation

Jianwei Qin, Kuanglin Chao, and Moon S. Kim "Line-scan spatially offset Raman spectroscopy for inspecting subsurface food safety and quality", Proc. SPIE 9864, Sensing for Agriculture and Food Quality and Safety VIII, 98640C (17 May 2016); https://doi.org/10.1117/12.2223746

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