Current liquid crystal technologies often rely on the use of optically thin cells and new liquid crystals. The characterisation of their parameters, such as elastic constants, including twist elastic constant and pretilt, key to control the liquid crystal response, poses several challenges. We present an optical method that successfully characterises such liquid crystal devices, is relatively simple yet a powerful probe of their static and dynamical properties. The method is demonstrated for the cells with the total phase lag smaller than 2pi and for experimental liquid crystals, where optical and dielectric properties are only partially known and for estimating K2.
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