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Inelastic electron-light scattering between electrons and optical modes renders ultrafast transmission electron microscopes an ideal platform for investigating optical properties on the nanoscale. Building on this technique, we demonstrate the spatial and spectral characterization of the intracavity field of a photonic chip-based, high-Q silicon nitride microresonator by means of free electron light interaction. By combining optical and electron spectroscopies, we probe the emergence of various nonlinear intracavity states, including dissipative Kerr solitons. This novel combination of nonlinear integrated photonics and electron microscopy promises new schemes in electron beam manipulation as well as electron-based probing of optical microresonator states.
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