Presentation
7 June 2023 Development of silicon foil X-ray optics using hot plastic deformation process (Conference Presentation)
Author Affiliations +
Abstract
We have been developing silicon foil X-ray optics using a hot plastic deformation process for future astronomical observations. Our foil mirror is made of a 0.3-mm thick silicon wafer and is plastically deformed into a high-accurate conical shape with a curvature radius of ~100 mm. The angular resolution we evaluated using a test sample mirror was ~32 arcseconds in the best region. We have also successfully coated a platinum film on the foil mirror using the atomic layer deposition process. In this talk, we report on the fabrication method and the X-ray imaging capability of our silicon foil X-ray optics.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masaki Numazawa, Manabu Ishida, Yuichiro Ezoe, Mai Takeo, Asca Miyamoto, Kumi Ishikawa, Kohei Morishita, and Kazuo Nakajima "Development of silicon foil X-ray optics using hot plastic deformation process (Conference Presentation)", Proc. SPIE PC12576, EUV and X-ray Optics: Synergy between Laboratory and Space VIII, PC1257603 (7 June 2023); https://doi.org/10.1117/12.2665153
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KEYWORDS
Silicon

X-ray optics

Semiconducting wafers

Mirrors

Spatial resolution

Wafer-level optics

X-ray imaging

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