Poster
24 November 2023 Contamination examination using laser damage morphology on fused silica polished with magnetic field-assisted finishing
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Conference Poster
Abstract
This conference presentation was prepared for Laser Damage, 2023.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Julian Long, Yuya Tsunezuka, Motoya Kurosaki, Tomosumi Kamimura, Ryohei Yasukuni, and Hitomi Yamaguchi "Contamination examination using laser damage morphology on fused silica polished with magnetic field-assisted finishing", Proc. SPIE PC12726, Laser-Induced Damage in Optical Materials 2023, PC1272611 (24 November 2023); https://doi.org/10.1117/12.2685249
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KEYWORDS
Polishing

Contamination

Surface finishing

Laser damage threshold

Silica

Laser induced damage

Magnetism

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